KIT33662JEFEVBE, Evaluation Kit for MC33662J CAN, LIN2.1/SAEJ2602-2, LIN Phy
การออกแบบอ้างอิง โดย: NXP Semiconductors
KIT33662JEFEVBE, Evaluation Board is supplied for preliminary evaluation purposes supporting the MC33662JEF CAN. This kit is populated with a production device and provides the opportunity to test the device in various configuration cases to quickly evaluate these features. This kit can also be used for Electro-Static Discharge (ESD) and Bulk Current Injection (BCI) tests
