DAC3151EVM, Evaluation Module for DAC3151 single-channel, 10-bit, 500-MSPS Digital-to-Analog Converter
참조 설계 작성자: Texas Instruments
DAC3151EVM, Evaluation Module allows designers to evaluate the performance of DAC3151 single-channel, 10-bit, 500-MSPS digital-to-analog converter (DAC). The EVM provides a flexible environment to test the DAC3151 under a variety of clock and input conditions. for ease of use as a complete IF transmit solution, the DAC3151EVM includes the CDCE62005 clock generator/jitter cleaner for clocking the DAC3151. The EVM can be used along with TSW1400 to perform a wide range of test procedures. The TSW1400 generates the test patterns which are fed to the DAC3151 through a 1.00 GSPS LVDS port
