TIDA-00076, Adjacent Channel Power Ratio (ACPR) and Error Vector Magnitude (%EVM) Measurements
参考設計 著者: Texas Instruments
TIDA-00076, Adjacent Channel Power Ratio (ACPR) and Error Vector Magnitude (%EVM) Measurements. This reference design discusses the use of the TSW3085EVM with the TSW3100 pattern generator to test adjacent channel power ratio (ACPR) and error vector magnitude (EVM) measurements of LTE baseband signals. By using the TSW3100 LTE GUI, patterns are loaded into the TSW3085EVM which is comprised of the DAC3482, TRF3705 and LMK04806
